DocumentCode :
2921201
Title :
Metal-semiconductor-metal traveling wave photodetectors
Author :
Shi, Jin-Wei ; Chen, Yen-Hung ; Liu, Tzu-Ming ; Chan, Ming-Che ; Gan, Kian-Giap ; Chiu, Yi-Jen ; Bowers, John E. ; Sun, Chi-Kuang
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
2
fYear :
2002
fDate :
10-14 Nov. 2002
Firstpage :
445
Abstract :
Low-temperature-grown GaAs (LTG-GaAs) based photodetectors (PDs) merit a lot of attentions due to their ultrahigh electrical bandwidth performances. We review the advantages and applications of LTG-GaAs based metal-semiconductor-metal traveling wave photodetectors (MSMTWPD) and discuss their ultra-high speed and record high power-bandwidth product performances in both short (∼800 nm) and long (∼1300 nm) wavelength regimes. The MSMTWPD has lower microwave loss and higher microwave velocity than the structure of p-i-n TWPD. The superior microwave guiding structure also implies that the electrical bandwidth is less sensitive to the photo-absorption volume. The measured impulse response and its corresponding frequency response of MSMTWPD are shown under high bias voltage (30 V) and high excitation optical pulse energy (∼71 pJ/pulse) at the wavelength of 800 nm. The obtained peak output voltage (Vp ∼30 V) and electrical bandwidth (190 GHz) product (5.7 THz-V) is the highest among all reported ultrahigh speed PDs. The excellent power-bandwidth product performance is due to short carrier lifetime of LTG-GaAs and superior microwave guiding structure. By utilizing the mid-gap defect states in LTG-GaAs, the photo-absorption in long wavelength regimes (1.3 μm-1.55 μm) can also be achieved. The record high power-bandwidth product performance among all reported high speed PDs in long wavelength regime has also been demonstrated with LTG-GaAs based MSMTWPD. However, compared with the high power performances in short wavelength regime, the demonstrated device exhibits a serious bandwidth degradation effect under ∼1.3 μm wavelength excitation. The different nonlinear behaviors at 1.3 μm wavelength possibly originate from that the photon energy (∼1 eV) is much higher than the subband-gap photon-absorption energy (∼0.7 eV), which will induce significant hot electron, inter-valley scatterings, and serious increasing in carrier lifetime. By contrast, the hot electron effect under short wavelength excitation (∼800 mn) is not evident as the photon energy of excitation wavelength is close to the band-to-band photo absorption energy.
Keywords :
III-V semiconductors; carrier lifetime; gallium arsenide; hot carriers; infrared detectors; metal-semiconductor-metal structures; photodetectors; 0.7 eV; 1 eV; 1.3 to 1.55 micron; 1300 nm; 190 GHz; 30 V; 800 nm; GaAs; band-to-band photo absorption energy; bandwidth degradation; carrier lifetime; electrical bandwidth; excitation wavelength photon energy; frequency response; high bias voltage; high excitation optical pulse energy; high power-bandwidth product performance; hot electron inter-valley scatterings; impulse response; long wavelength regime; long wavelength regimes; low-temperature-grown GaAs based photodetectors; metal-semiconductor-metal traveling wave photodetectors; microwave guiding structure; microwave loss; microwave velocity; mid-gap defect states; nonlinear behaviors; peak output voltage; photo-absorption; photo-absorption volume; short carrier lifetime; short wavelength regime; subband-gap photon-absorption energy; ultra-high speed; ultrahigh electrical bandwidth performance; Bandwidth; Charge carrier lifetime; Electrons; Energy measurement; Gallium arsenide; Optical pulses; PIN photodiodes; Photodetectors; Pulse measurements; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society, 2002. LEOS 2002. The 15th Annual Meeting of the IEEE
ISSN :
1092-8081
Print_ISBN :
0-7803-7500-9
Type :
conf
DOI :
10.1109/LEOS.2002.1159372
Filename :
1159372
Link To Document :
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