Practical test cores for the on-chip generation and evaluation of analog test signals: Application to a network/spectrum analyzer for analog BIST

Author

Barragán, Manuel J. ; Vázquez, Diego ; Rueda, Adoración

Author_Institution

Inst. de Microelectron. de Sevilla, Univ. de Sevilla, Sevilla, Spain

fYear

2009

fDate

12-17 July 2009

Firstpage

244

Lastpage

247

Abstract

This paper presents practical implementations of test cores for analog and mixed-signal BIST. A sinewave generator for test stimulus generation, and a periodical signal characterization system for response evaluation are discussed. Integrated prototypes and experimental results are provided, and a prototype of a network/spectrum analyzer featuring both test cores has been developed and tested in the lab.

Keywords

analogue integrated circuits; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; network analysers; signal generators; spectral analysers; analog BIST; analog test signals; built-in self-test; integrated prototypes; mixed-signal BIST; network-spectrum analyzer; on-chip generation; periodical signal characterization system; practical test cores; sinewave generator; test stimulus generation; Built-in self-test; Capacitors; Character generation; Circuit testing; Digital filters; Network-on-a-chip; Prototypes; Signal generators; Spectral analysis; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Research in Microelectronics and Electronics, 2009. PRIME 2009. Ph.D.

Conference_Location

Cork

Print_ISBN

978-1-4244-3733-7

Electronic_ISBN

978-1-4244-3734-4

Type

conf

DOI

10.1109/RME.2009.5201327

Filename

5201327