DocumentCode
2921224
Title
Digitally-tunable mems filter using mechanically-coupled resonator array
Author
Chandrahalim, Hengky ; Bhave, Sunil A.
Author_Institution
Cornell Univ., Ithaca
fYear
2008
fDate
13-17 Jan. 2008
Firstpage
1020
Lastpage
1023
Abstract
This paper reports on the design of a bandwidth-tunable RF MEMS filter using a series-coupled array of dielectrically-transduced square-extensional mode resonators. The proposed digital tuning scheme provides channel-agility and bandwidth granularity for analog spectral processors and RF spectrum analyzers. The resonators and filters are fabricated on the 3 mum thick device layer of a heavily doped SOI wafer with a 100 nm thick silicon nitride film sandwiched between the polysilicon electrodes and the silicon device layer. A 511 MHz overtone square-extensional mode resonator is demonstrated with a quality factor (Q) of 1,800 in air and motional impedance (RX) of 1.1 kOmega. An array of four such resonators is coupled mechanically to form a channel-select filter with 1.4 MHz bandwidth at 509 MHz center frequency. By switching the DC-biasing scheme, the filter is split into narrower high and low sub-bands, each 700 kHz wide.
Keywords
Q-factor; micromechanical resonators; radiofrequency filters; silicon compounds; silicon-on-insulator; spectral analysers; DC-biasing scheme; RF spectrum analyzers; Si-SiO2; SiN; analog spectral processors; bandwidth 1.4 MHz; bandwidth granularity; channel-agility; channel-select filter; dielectrically-transduced square-extensional mode resonators; digital tuning scheme; digitally-tunable MEMS filter; frequency 509 MHz; frequency 511 MHz; heavily doped SOI wafer; mechanically-coupled resonator array; motional impedance; overtone square-extensional mode resonator; polysilicon electrodes; quality factor; series-coupled array; silicon device layer; silicon nitride film; size 100 nm; size 3 mum; Bandwidth; Dielectrics; Digital filters; Electrodes; Radio frequency; Radiofrequency microelectromechanical systems; Resonator filters; Semiconductor films; Silicon; Spectral analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location
Tucson, AZ
ISSN
1084-6999
Print_ISBN
978-1-4244-1792-6
Electronic_ISBN
1084-6999
Type
conf
DOI
10.1109/MEMSYS.2008.4443832
Filename
4443832
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