• DocumentCode
    292123
  • Title

    Determination of SAW velocity shift and reflection coefficients for SPUDT structures

  • Author

    Hahn, Y. ; Thoma, C. ; Bhattacharjee, K. ; Henderson, D. ; Garber, E.

  • Volume
    1
  • fYear
    1994
  • fDate
    Oct. 31 1994-Nov. 3 1994
  • Firstpage
    233
  • Abstract
    Design of SPUDT type SAW devices requires accurate values or velocity shifts and reflection coefficients associated with asymmetric finger overlays in each unit cell. Until now, these parameters have been deduced experimentally since accurate theoretical models are not available. Previous work has been limited to symmetric and periodic structures. We report extension of the model to analyses of EWC and DART. The first-order reflection coefficients r1 and velocity shift s1 are computed for several standard SAW materials and cuts. The sensitivity of r and s to variations in the finger geometry is determined for the SPUDT structure. Comparison between theoretical and experimental results for 34°-quartz and 112° LiTaO3 are presented. The second order effects of evanescent and bulk waves of higher harmonics coupled to the fundamental components are expected to be important for thicker fingers
  • Keywords
    acoustic wave reflection; acoustic wave velocity measurement; lithium compounds; quartz; surface acoustic wave transducers; ultrasonic transducers; DART; EWC; LiTaO3; SAW devices; SAW reflection coefficients; SAW velocity shift; SPUDT structures; SiO2; asymmetric finger overlays; bulk waves; evanescent waves; finger geometry; first-order reflection coefficients; quartz; Acoustic reflection; Acoustic velocity measurement; Lithium materials/devices; Quartz materials/devices; Surface acoustic wave transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1994. Proceedings., 1994 IEEE
  • Conference_Location
    Cannes, France
  • Print_ISBN
    0-7803-2012-3
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1994.401585
  • Filename
    401585