DocumentCode :
2921523
Title :
A fully dry self-assembly process with proper in-plane orientation
Author :
Park, Sangjun ; Böhringer, Karl F.
Author_Institution :
Washington Univ., Seattle
fYear :
2008
fDate :
13-17 Jan. 2008
Firstpage :
1077
Lastpage :
1080
Abstract :
A fully dry self-assembly method for chip-to-wafer stacking is developed in this paper. The assembly elements and substrate have complementary and interlocking features that place the assembly parts in the designated binding sites on the substrate. Proper in-plane orientation is achieved by deploying secondary features on the parts and substrate. These features are fabricated by a series of silicon deep RIE, sidewall passivation coating and isotropic etching. Experimental results show 100% assembly is accomplished on substrates with 2cm diameter, and 95% of assembly is done within 1 minute.
Keywords :
assembling; chip scale packaging; integrated circuit packaging; passivation; sputter etching; substrates; wafer level packaging; chip-to-wafer stacking; dry self-assembly process; interlocking feature; isotropic etching; proper in-plane orientation; sidewall passivation coating; silicon deep RIE; substrate; Assembly systems; Coatings; Etching; Fabrication; Passivation; Pins; Self-assembly; Silicon; Stacking; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location :
Tucson, AZ
ISSN :
1084-6999
Print_ISBN :
978-1-4244-1792-6
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2008.4443846
Filename :
4443846
Link To Document :
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