DocumentCode :
2921535
Title :
Study on a new sub-wavelength grating for antireflective structure of solar cell
Author :
Hui-min Xia ; Kai-Hong Song ; Ru-ru Wang ; Lu-lu Peng
Author_Institution :
Key Lab. of Intell. Comput. & Signal Process., Anhui Univ., Hefei, China
fYear :
2012
fDate :
22-26 Oct. 2012
Firstpage :
778
Lastpage :
781
Abstract :
A new sub-wavelength grating for Anti-Reflective (AR) coating layer of solar cells is proposed in this paper. The reflectivity of this structure is investigated by the Rigorous Coupled Wave Analysis (RCWA) method. Numerical results show that compared with general SiO2 AR coating layer, the average reflectivity of this new structure has greatly been reduced by 16% and 10.85% under TE and TM modes respectively. And the average reflection rate is less than 6% when the incident wave is working in a range of the wavelength between 400 nm and 1400nm. Good performance of the new structure makes it possible to develop practical applications.
Keywords :
diffraction gratings; silicon compounds; solar cells; AR coating layer; RCWA method; SiO2; TE mode; TM mode; antireflective structure; reflectivity; rigorous coupled wave analysis method; solar cell; subwavelength grating; wavelength 400 nm to 1400 nm; Coatings; Gratings; Numerical models; Photovoltaic cells; Reflection; Reflectivity; Silicon; AR coating layer; RCWA; Solar cell; Sub-wavelength grating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas, Propagation & EM Theory (ISAPE), 2012 10th International Symposium on
Conference_Location :
Xian
Print_ISBN :
978-1-4673-1799-3
Type :
conf
DOI :
10.1109/ISAPE.2012.6408887
Filename :
6408887
Link To Document :
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