Title :
Optical time-division demultiplexing with resonant-cavity-enhanced surface emitted second-harmonic generation
Author :
Ulmer, T.G. ; Gross, M.C. ; Patel, K.M. ; Kenan, R.P. ; Ralph, S.E. ; Verber, C.M. ; SpringThorpe, A.J.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Summary form only given. We have incorporated a vertical microcavity into an all-optical serial-to-parallel converter based on surface-emitted second-harmonic generation (SESHG). By resonating at the second-harmonic wavelength, the conversion efficiency is improved sufficiently to allow bit error rate (BER) measurements on an SESHG demultiplexer for the first time. This optical time-division demultiplexer has the important advantage that a single device can recover all of the multiplexed channels in a single operation. The SESHG structure is comprised of a quasi-phase-matched (QPM) waveguide imbedded between two distributed Bragg reflectors (DBRs), which form a microcavity resonator.
Keywords :
cavity resonators; demultiplexing; demultiplexing equipment; error statistics; micro-optics; optical communication equipment; optical harmonic generation; optical phase matching; optical resonators; optical waveguide components; time division multiplexing; all-optical serial-to-parallel converter; bit error rate measurements; conversion efficiency; distributed Bragg reflectors; microcavity resonator; multiplexed channels; optical time-division demultiplexer; optical time-division demultiplexing; quasi-phase-matched waveguide; resonant-cavity-enhanced surface emitted second-harmonic generation; second-harmonic wavelength; surface-emitted second-harmonic generation; vertical microcavity; Bit error rate; Demultiplexing; Microcavities; Optical resonators; Optical surface waves; Optical waveguides; Resonance; Time measurement; Wavelength conversion; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.906902