Title :
Test data compression based on the reuse of parts of the dictionary entries
Author :
Sismanoglou, P. ; Nikolos, D.
Author_Institution :
Dept. of Comput. Eng. & Inf., Univ. of Patras, Patras, Greece
Abstract :
In this paper we show that the test data compression achieved by a dictionary based method can be improved significantly by suitably reusing parts of the dictionary entries. To this end two new algorithms are proposed, suitable for partial and complete dictionary coding respectively. The efficiency of the proposed techniques is supported with extensive simulation results.
Keywords :
data compression; encoding; integrated circuit testing; complete dictionary coding; dictionary entries; partial dictionary coding; suitably reusing parts; test data compression; Design automation; Dictionaries; Encoding; Hardware; Indexes; Test data compression; Vectors;
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2011 18th IEEE International Conference on
Conference_Location :
Beirut
Print_ISBN :
978-1-4577-1845-8
Electronic_ISBN :
978-1-4577-1844-1
DOI :
10.1109/ICECS.2011.6122331
