DocumentCode
2921701
Title
Test data compression based on the reuse of parts of the dictionary entries
Author
Sismanoglou, P. ; Nikolos, D.
Author_Institution
Dept. of Comput. Eng. & Inf., Univ. of Patras, Patras, Greece
fYear
2011
fDate
11-14 Dec. 2011
Firstpage
538
Lastpage
541
Abstract
In this paper we show that the test data compression achieved by a dictionary based method can be improved significantly by suitably reusing parts of the dictionary entries. To this end two new algorithms are proposed, suitable for partial and complete dictionary coding respectively. The efficiency of the proposed techniques is supported with extensive simulation results.
Keywords
data compression; encoding; integrated circuit testing; complete dictionary coding; dictionary entries; partial dictionary coding; suitably reusing parts; test data compression; Design automation; Dictionaries; Encoding; Hardware; Indexes; Test data compression; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems (ICECS), 2011 18th IEEE International Conference on
Conference_Location
Beirut
Print_ISBN
978-1-4577-1845-8
Electronic_ISBN
978-1-4577-1844-1
Type
conf
DOI
10.1109/ICECS.2011.6122331
Filename
6122331
Link To Document