Title :
Lock-in thermography for the localization of prebreakdown leakage current on power diodes
Author :
Riccio, M. ; Irace, A. ; Breglio, G.
Author_Institution :
Dept. of Biomed. Electron. & Telecommun. Eng., Univ. of Naples Federico II, Naples, Italy
Abstract :
In this paper we show how the Lock-In Thermography (LIT) technique is a valid choice to obtain information on the pre-breakdown leakage current distribution on power diodes. To do this we describe the LIT principle and our in house made experimental set-up. We finally show interesting experimental results on power Schottky diodes.
Keywords :
Schottky diodes; avalanche breakdown; current distribution; infrared imaging; leakage currents; semiconductor device reliability; temperature measurement; current distribution; lock-in thermography; power Schottky diodes; prebreakdown leakage current localization; Biomedical electronics; Biomedical engineering; Frequency; Leakage current; Power engineering and energy; Power harmonic filters; Power measurement; Schottky diodes; Temperature sensors; Voltage;
Conference_Titel :
Research in Microelectronics and Electronics, 2009. PRIME 2009. Ph.D.
Conference_Location :
Cork
Print_ISBN :
978-1-4244-3733-7
Electronic_ISBN :
978-1-4244-3734-4
DOI :
10.1109/RME.2009.5201357
