DocumentCode :
2921905
Title :
Nanoimprinting for optical device fabrication: some polymer issues
Author :
Torres, C. M. Sotomayor ; Hoffmann, T. ; Sidiki, T.P. ; Bruchhaus, L. ; Bruch, L.-U. ; Ahopelto, Jouni ; Schulz, H. ; Scheer, H.-C. ; Cardinaud, C. ; Pfeiffer, Klaus
Author_Institution :
Dept. of Electr. Eng., Wuppertal Univ., Germany
fYear :
2000
fDate :
7-12 May 2000
Firstpage :
211
Abstract :
Summary form only given, as follows. We review the salient aspects of nanoimprinting, nanoembossing and molding for optical device fabrication and report on our study of nanoimprint lithography oriented towards the fabrication of waveguides and MSM detectors. The driving force is the possibility to use this parallel fabrication approach to make integrated optical devices in planar geometry, which, in some parts, exhibit a higher resolution than optical lithography. The minimum feature size we have reliably obtained is 50 nm over areas of 2/spl times/2 square cm. Most of the work has concentrated on the investigation of suitable polymers, for which a set of thermoplastic properties and a window of parameters have been identified for both printing and dry etching. The example of the Y-junction planar waveguide on a SOI wafer is described in detail, since this incorporates micrometer and sub-micrometer features, the latter in the form of a photonic crystal mirror in one of its arms. Graphite and triangular lattices have been printed to investigate the limits of this nanofabrication approach with respect to high packing density, high aspect ratio and submicron feature sizes. We report on the optical characterization of these waveguides and discuss the prospects of three-dimensional molding using a templating approach for optical devices.
Keywords :
etching; moulding; nanotechnology; optical fabrication; optical planar waveguides; optical polymers; photolithography; silicon-on-insulator; MSM detectors; SOI wafer; Y-junction planar waveguide; aspect ratio; dry etching; fabrication; fabrication approach; graphite lattices; integrated optical devices; micrometer features; minimum feature size; molding; nanoembossing; nanofabrication approach; nanoimprint lithography; nanoimprinting; optical characterization; optical device fabrication; optical devices; optical lithography; packing density; photonic crystal mirror; planar geometry; polymer issues; printing; resolution; review; salient aspect; sub-micrometer features; submicron feature sizes; templating approach; thermoplastic properties; three-dimensional molding; triangular lattices; waveguides; Geometrical optics; Integrated optics; Lithography; Nanolithography; Nanoscale devices; Optical device fabrication; Optical devices; Optical polymers; Optical waveguides; Printing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
Type :
conf
DOI :
10.1109/CLEO.2000.906924
Filename :
906924
Link To Document :
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