DocumentCode
2922003
Title
Zero Defects Quality and Reliability Challenges for Growing Markets
Author
Dakshinamoorthy, S.
fYear
2008
fDate
12-16 Oct. 2008
Abstract
Freescale Semiconductor anticipates future industry growth in consumer, automotive, industrial and networking markets. Smart semiconductors expect to become more pervasive in automotive markets as consumer demand reacts to rising energy costs. And the semiconductor presence within the medical market grows, in part due to the increasing amount of healthcare required by the Baby Boomer generation, and also by the elevation of the quality of care afforded through microelectronic devices. Given expected growth in the noted markets, there is a continuous push to deliver Zero Defects quality and reliability Meeting these requirements becomes challenging as technology scales and wear-out mechanisms such as NBTI have a stronger impact. New DFT/DFM/containment methodologies as well as supporting data for delivering Zero Defects quality will be discussed in addition to new reliability methodologies and supporting data for guardbanding power (Vmin) and speed (Fmax) against wear-out mechanisms.
Keywords
consumer electronics; design for manufacture; design for testability; semiconductor device reliability; semiconductor industry; DFM; DFT; NBTI; containment method; freescale semiconductor; microelectronic devices; reliability; zero defects quality; Automotive engineering; Costs; Design for manufacture; Medical services; Microelectronics; Pediatrics; Quality assurance; Semiconductor device reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location
S. Lake Tahoe, CA
ISSN
1930-8841
Print_ISBN
978-1-4244-2194-7
Electronic_ISBN
1930-8841
Type
conf
DOI
10.1109/IRWS.2008.4796071
Filename
4796071
Link To Document