• DocumentCode
    2922003
  • Title

    Zero Defects Quality and Reliability Challenges for Growing Markets

  • Author

    Dakshinamoorthy, S.

  • fYear
    2008
  • fDate
    12-16 Oct. 2008
  • Abstract
    Freescale Semiconductor anticipates future industry growth in consumer, automotive, industrial and networking markets. Smart semiconductors expect to become more pervasive in automotive markets as consumer demand reacts to rising energy costs. And the semiconductor presence within the medical market grows, in part due to the increasing amount of healthcare required by the Baby Boomer generation, and also by the elevation of the quality of care afforded through microelectronic devices. Given expected growth in the noted markets, there is a continuous push to deliver Zero Defects quality and reliability Meeting these requirements becomes challenging as technology scales and wear-out mechanisms such as NBTI have a stronger impact. New DFT/DFM/containment methodologies as well as supporting data for delivering Zero Defects quality will be discussed in addition to new reliability methodologies and supporting data for guardbanding power (Vmin) and speed (Fmax) against wear-out mechanisms.
  • Keywords
    consumer electronics; design for manufacture; design for testability; semiconductor device reliability; semiconductor industry; DFM; DFT; NBTI; containment method; freescale semiconductor; microelectronic devices; reliability; zero defects quality; Automotive engineering; Costs; Design for manufacture; Medical services; Microelectronics; Pediatrics; Quality assurance; Semiconductor device reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
  • Conference_Location
    S. Lake Tahoe, CA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4244-2194-7
  • Electronic_ISBN
    1930-8841
  • Type

    conf

  • DOI
    10.1109/IRWS.2008.4796071
  • Filename
    4796071