Title :
The evaluation of 16-Mbit memory chips with built-in reliability
Author :
Stapper, Charles H. ; Klaasen, William A.
Author_Institution :
IBM, Essex Junction, VT, USA
fDate :
March 31 1992-April 2 1992
Abstract :
Highly defective 16-Mb chips have been stressed under accelerated conditions to test the capability of on-chip error-correction circuits for reliability enhancement. The tradeoff between a manufacturing sort or screen yield and reliability was determined. The soft-error immunity of the trench capacitor technology in conjunction with error correction was also evaluated under accelerated conditions.<>
Keywords :
DRAM chips; alpha-particle effects; circuit reliability; error correction codes; integrated circuit testing; life testing; 16 Mbit; DRAM chips; accelerated conditions; alpha particle sensitivity; built-in reliability; memory chips; on-chip error-correction circuits; reliability enhancement; screen yield; soft-error immunity; trench capacitor technology; Acceleration; Circuit faults; Circuit testing; DRAM chips; Error correction; Error correction codes; Life estimation; Manufacturing; Probability; Redundancy;
Conference_Titel :
Reliability Physics Symposium 1992. 30th Annual Proceedings., International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-0473-X
DOI :
10.1109/RELPHY.1992.187613
