DocumentCode
2922200
Title
Dynamic Characterization of Intensity Fluctuations in Semiconductor Lasers under Digital Modulation
Author
Ahmed, Moustafa ; Yamada, Minoru
Author_Institution
Minia University, Egypt; m.m.farghal@link.net
fYear
2005
fDate
30-02 Aug. 2005
Firstpage
530
Lastpage
531
Abstract
We report on modeling of intensity fluctuations in semiconductor lasers subject to low and high speed digital modulation. We examine influence of deciding both decision and sampling times on bit-error-rate (BER). Correlation between BER and relative intensity noise (RIN) is presented.
Keywords
Bit error rate; digital modulation; fluctuation; noise; semiconductor lasers; Bit error rate; Digital modulation; Digital systems; Fluctuations; Laser modes; Laser noise; Sampling methods; Semiconductor device noise; Semiconductor lasers; Signal analysis; Bit error rate; digital modulation; fluctuation; noise; semiconductor lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2005. CLEO/Pacific Rim 2005. Pacific Rim Conference on
Print_ISBN
0-7803-9242-6
Type
conf
DOI
10.1109/CLEOPR.2005.1569496
Filename
1569496
Link To Document