DocumentCode
2922235
Title
Radiative lifetimes and fractional thermal loading of Yb/sub 3/Al/sub 5/O/sub 10/ (YbAG) and highly-doped Yb:Y/sub 3/Al/sub 5/O/sub 12/ (Yb:YAG)
Author
Patel, F.D. ; Honea, E.C. ; Speth, I. ; Payne, Stephen A. ; Hutcheson, R. ; Equall, R.
Author_Institution
Lawrence Livermore Nat. Lab., CA, USA
fYear
2000
fDate
7-12 May 2000
Firstpage
226
Abstract
Summary form only given. Combined with appropriate laser designs such as the thin disk and waveguide architectures, highly-doped solid-state laser materials offer the potential for higher average power scaling and improved thermal management. Because stress fracture is limited by thermal gradient, the ability to keep the gain element thin while still having sufficient rare earth ion density to absorb the pump light can allow higher pump intensities and efficiencies. To date impurities in the crystals have limited the usefulness of high concentration Yb:YAG. At higher Yb/sup 3+/ concentrations, energy migration makes the fluorescence lifetime and fractional heat loading particularly sensitive to defects. The work described here addresses some of the questions that have been raised regarding the maximum useful Yb/sup 3+/ concentration in YAG. We systematically measured the fractional heat loading, radiative lifetimes and other material properties.
Keywords
garnets; optical materials; radiative lifetimes; solid lasers; stimulated emission; thermo-optical effects; ytterbium; ytterbium compounds; Y/sub 3/Al/sub 5/O/sub 12/:Yb; Yb/sub 3/Al/sub 5/O/sub 10/; Yb/sup 3+/ concentration; Yb:Y/sub 3/Al/sub 5/O/sub 12/; fluorescence lifetime; fractional heat loading; fractional thermal loading; gain element; higher average power scaling; highly-doped; highly-doped solid-state laser materials; laser designs; material properties; pump light absorption; radiative lifetimes; rare earth ion density; stress fracture; thermal management; thin disk; waveguide architectures; Energy management; Impurities; Optical design; Optical materials; Power lasers; Solid lasers; Thermal loading; Thermal management; Thermal stresses; Waveguide lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
1-55752-634-6
Type
conf
DOI
10.1109/CLEO.2000.906943
Filename
906943
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