• DocumentCode
    2922278
  • Title

    A CNFET-based characterization framework for digital circuits

  • Author

    Athow, Jacques L. ; Rozon, Come ; Al-Khalili, Dhamin ; Langlois, J. M Pierre

  • Author_Institution
    Dept. of Electr. & Comput. Eng., R. Mil. Coll. of Canada, Kingston, ON, Canada
  • fYear
    2011
  • fDate
    11-14 Dec. 2011
  • Firstpage
    681
  • Lastpage
    684
  • Abstract
    This paper introduces a framework to develop and characterize digital circuits using Carbon Nanotube Field Effect Transistors (CNFET). We define a 4-step process that involves design capture, pre-processing, circuit simulation and results extraction and interpretation. The initial work leading to this framework involves the selection of appropriate CNFET model and model parameters, and determination of optimized substrate voltage. Through a set of custom-design automated scripts, various logic gates were simulated, data were compiled and characterization results were obtained. A complete approximate squarer circuit was also designed, implemented and characterized using the framework. To demonstrate the power of Carbon Nanotube technology, the same circuit was also implemented in 16 nm CMOS technology for comparison. An improvement by factor of 17× in PDP was achieved with CNT.
  • Keywords
    MOSFET; carbon nanotube field effect transistors; digital circuits; logic gates; CMOS technology; CNFET-based characterization framework; PDP; approximate squarer circuit; carbon nanotube field effect transistor; circuit simulation; custom-design automated script; design capture processing; digital circuit; logic gate; size 16 nm; substrate voltage optimization; CMOS integrated circuits; CNTFETs; Delay; Electron tubes; Integrated circuit modeling; Logic gates; Mathematical model; Arithmetic; CNFET; Carbon Nanotube; Squarer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems (ICECS), 2011 18th IEEE International Conference on
  • Conference_Location
    Beirut
  • Print_ISBN
    978-1-4577-1845-8
  • Electronic_ISBN
    978-1-4577-1844-1
  • Type

    conf

  • DOI
    10.1109/ICECS.2011.6122366
  • Filename
    6122366