Title :
Compatibility testing of fluorescent lamp and ballast systems
Author :
Ji, Yunfen ; Davis, Robert ; O´Rourke, C. ; Chul, E.
Author_Institution :
Lighting Res. Center, Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
The rapid growth in the use of electronic ballasts, for fluorescent lighting systems, and the corresponding increase in the number of new products and new manufacturers in the market, has raised a number of questions regarding the compatibility of the lamps and ballasts used in fluorescent systems. Because many of the new products start and operate lamps differently than previous products, the relevant ANSI requirements may no longer be adequate for addressing compatibility concerns. The impacts on system performance of the newer products has not been well established. This paper reports the results of a parametric study designed to test key hypotheses regarding the impacts of key ballast parameters on fluorescent lamp life. In this study, samples of four-foot T8 fluorescent lamps were operated on duty cycles of five minutes on and five minutes off, using seven different ballast types. The results of the study indicate which parameters seem to have the biggest effect on lamp life, and can be used in establishing new performance standards for fluorescent systems
Keywords :
fluorescent lamps; lamp accessories; life testing; 4 feet; 5 min; compatibility testing; duty cycles; electronic ballast systems; fluorescent lamp; fluorescent lighting; lamp life testing; parametric study; performance standards; ANSI standards; Coatings; Electrodes; Electronic ballasts; Fluorescent lamps; Life testing; Manufacturing; System performance; System testing; Temperature;
Conference_Titel :
Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-4067-1
DOI :
10.1109/IAS.1997.626389