• DocumentCode
    2922442
  • Title

    Power, performance and area prediction of 3D ICs during early stage design exploration in 45nm

  • Author

    Toufexis, Filippos ; Papanikolaou, Antonis ; Soudris, Dimitrios ; Stamoulis, George ; Bantas, Sotiris

  • Author_Institution
    Electr. & Electron. Eng., Stanford Univ., Stanford, CA, USA
  • fYear
    2011
  • fDate
    11-14 Dec. 2011
  • Firstpage
    715
  • Lastpage
    718
  • Abstract
    In this work, the impact of across-chip temperature and power supply voltage variations, on performance predictions in 3D ICs, is investigated. To make this possible, a novel design flow is proposed to perform design exploration of 3D ICs. Power supply voltage and thermal variations are modeled, to allow accurate PPA (power, performance and area) predictions. Using the main parts of this design flow, in a system comprising hundreds of million gates, complicated mechanisms are shown to determine the performance of the system. With increasing number of dies, timing is shown to exhibit 4 distinct regions, where either temperature or voltage drop is the dominant limiting factor. Power consumption does not scale monotonically with increasing die number. As a consequence, optimum system performance is in no way achieved by minimizing temperature and voltage drop, as is assumed in the literature so far. The across-chip temperature and power supply voltage variations are finally shown to cause on average 40% increase in timing and 53% decrease in power consumption, compared to the assumption of nominal conditions.
  • Keywords
    electric potential; low-power electronics; power supply circuits; three-dimensional integrated circuits; 3DIC; across-chip temperature; area prediction; design exploration; performance prediction; power consumption; power prediction; power supply voltage variations; size 45 nm; thermal variations; voltage drop; Estimation; Logic gates; Power demand; Temperature; Three dimensional displays; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems (ICECS), 2011 18th IEEE International Conference on
  • Conference_Location
    Beirut
  • Print_ISBN
    978-1-4577-1845-8
  • Electronic_ISBN
    978-1-4577-1844-1
  • Type

    conf

  • DOI
    10.1109/ICECS.2011.6122374
  • Filename
    6122374