DocumentCode :
2922640
Title :
Single Wafer Management: A solution for 300mm Prime & improved wafer storage quality
Author :
Zaugg, Franz ; Ritzmann, Heinz
Author_Institution :
Tec-Sem AG, Taegerwilen
fYear :
2007
fDate :
11-12 June 2007
Firstpage :
209
Lastpage :
213
Abstract :
The "300 mm prime initiative" stands for the search of the semiconductor industry for concepts which offer improved productivity. Analysis of state-of-the-art fabs has shown that the true process time of a wafer is much less than 10% of the overall time the wafer spends in the fab. This results in extremely long cycle times (typically 3-4 months), huge wafer traffic and unmoved WIP. The main topics of the 300 mm prime discussion are therefore: (1) Reduced overall cycle time (2) Efficiently handle small and large lots. As discussed at the ISMI/Sematech meeting in Austin in 2006, the concepts applied for 300 mm prime should also serve as a role model for 450 mm.
Keywords :
integrated circuit yield; quality management; ISMI-Sematech meeting; overall cycle time reduction; semiconductor industry; single wafer management; size 300 mm; size 450 mm; state-of-the-art fabs technology; time 3 month to 4 month; wafer storage quality; Costs; Electronics industry; Hardware; Logistics; Poles and towers; Productivity; Quality management; Sorting; Traffic control; Transportation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2007. ASMC 2007. IEEE/SEMI
Conference_Location :
Stresa
Print_ISBN :
1-4244-0652-8
Electronic_ISBN :
1-4244-0653-6
Type :
conf
DOI :
10.1109/ASMC.2007.375094
Filename :
4259260
Link To Document :
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