• DocumentCode
    2922765
  • Title

    The bond shear test: an application for the reduction of common causes of gold ball bond process variation

  • Author

    Guzman, Melissa Shell-De ; Mahaney, Michael

  • Author_Institution
    Intel Corp., Santa Clara, CA, USA
  • fYear
    1992
  • fDate
    March 31 1992-April 2 1992
  • Firstpage
    251
  • Lastpage
    257
  • Abstract
    Examples indicate that the bond shear test can be used effectively to reduce common cause variability in the wire bond process, allowing in-process monitors to detect unusual events in the process more efficiently. The first example illustrates that before a process can be improved, its measurement system must have less variability than the process it measures. The second example, an investigation of capillary change effects, illustrates that the sensitivity of bond shear can be used to identify bonder components that contribute significantly to process variability. The third example suggests that shear results can be used as a standard whereby a given bonder´s power and force parameters can be set to produce consistent bond strengths over time, and many bonders can be set to produce bonds of similar strengths.<>
  • Keywords
    gold; lead bonding; process control; reliability; Au ball bond process; Au-Al; bond shear test; capillary change effects; consistent bond strengths; in-process monitors; process variation reduction; wire bond process; Bonding forces; Force measurement; Gold; Inspection; Packaging; Production; Reactive power; Temperature; Testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium 1992. 30th Annual Proceedings., International
  • Conference_Location
    San Diego, CA, USA
  • Print_ISBN
    0-7803-0473-X
  • Type

    conf

  • DOI
    10.1109/RELPHY.1992.187654
  • Filename
    187654