DocumentCode
2922765
Title
The bond shear test: an application for the reduction of common causes of gold ball bond process variation
Author
Guzman, Melissa Shell-De ; Mahaney, Michael
Author_Institution
Intel Corp., Santa Clara, CA, USA
fYear
1992
fDate
March 31 1992-April 2 1992
Firstpage
251
Lastpage
257
Abstract
Examples indicate that the bond shear test can be used effectively to reduce common cause variability in the wire bond process, allowing in-process monitors to detect unusual events in the process more efficiently. The first example illustrates that before a process can be improved, its measurement system must have less variability than the process it measures. The second example, an investigation of capillary change effects, illustrates that the sensitivity of bond shear can be used to identify bonder components that contribute significantly to process variability. The third example suggests that shear results can be used as a standard whereby a given bonder´s power and force parameters can be set to produce consistent bond strengths over time, and many bonders can be set to produce bonds of similar strengths.<>
Keywords
gold; lead bonding; process control; reliability; Au ball bond process; Au-Al; bond shear test; capillary change effects; consistent bond strengths; in-process monitors; process variation reduction; wire bond process; Bonding forces; Force measurement; Gold; Inspection; Packaging; Production; Reactive power; Temperature; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium 1992. 30th Annual Proceedings., International
Conference_Location
San Diego, CA, USA
Print_ISBN
0-7803-0473-X
Type
conf
DOI
10.1109/RELPHY.1992.187654
Filename
187654
Link To Document