Title :
Discussion Group (DG) summary: fast Wafer Level Reliability (fWLR) Monitoring
Author_Institution :
Central reliability department, Infineon Technologies AG, tel: +49-89-234-45257; fax: +49-89-234-9557386; e-mail: andreas.martin@infineon.com
Keywords :
Condition monitoring; Foundries; Life testing; Materials testing; Packaging; Process control; Qualifications; Stress measurement; System testing; Wafer scale integration;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796113
