Title :
Discussion Group (DG) summary: NBTI
Author_Institution :
Technical University of Vienna, tel: +41-1-58801-36023; fax: +41-1-58801-36099; e-mail: grasser@iue.tuwien.ac.at
Keywords :
Delay; Dielectrics; Electron traps; Electronic mail; Hydrogen; Interface states; Measurement techniques; Niobium compounds; Particle measurements; Titanium compounds;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796115
