DocumentCode

2922846

Title

Discussion Group (DG) summary: NBTI

Author

Grasser, Tibor

Author_Institution

Technical University of Vienna, tel: +41-1-58801-36023; fax: +41-1-58801-36099; e-mail: grasser@iue.tuwien.ac.at

fYear

2008

fDate

12-16 Oct. 2008

Firstpage

151

Lastpage

151

Keywords

Delay; Dielectrics; Electron traps; Electronic mail; Hydrogen; Interface states; Measurement techniques; Niobium compounds; Particle measurements; Titanium compounds;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International

Conference_Location

South lake Tahoe, CA, USA

ISSN

1930-8841

Print_ISBN

978-1-4244-2194-7

Electronic_ISBN

1930-8841

Type

conf

DOI

10.1109/IRWS.2008.4796115

Filename

4796115