DocumentCode
2922971
Title
Morphological descriptors for automatic detection of epileptiform events
Author
Boos, Christine Fredel ; do Carmo Vitarelli Pereira, M. ; Argoud, Fernanda Isabel Marques ; De Azevedo, Fernando Mendes
Author_Institution
DEEL, Univ. Fed. de Santa Catarina, Florianopolis, Brazil
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
2435
Lastpage
2438
Abstract
The purpose of this study was to analyze morphological characteristics of electroencephalogram (EEG) signals in order to define a representation of epileptiform events that can distinguish them from other events occurring in the signal. There are several studies on parameterization of EEG signals, particularly for automatic detection of paroxysms related to epilepsy. Considering that during the automatic detection process the morphological characteristics pertaining to these events may get mixed up if only conventional descriptors are used, it was necessary to create a new set of parameters that reveal more differences between them. The parameters are fed to artificial neural networks and the individual and collective contribution of each parameter was evaluated by statistical process. The proposed method achieved a success rate of 80-90%, sensitivity and specificity between 85% and 96%.
Keywords
diseases; electroencephalography; mathematical morphology; medical signal detection; medical signal processing; neural nets; statistical analysis; EEG; artificial neural networks; automatic epileptiform event detection; electroencephalogram; epilepsy; morphological descriptors; paroxysms; signal parameterization; statistical process; Artificial neural networks; Electroencephalography; Entropy; Morphology; Neurons; Neurophysiology; Training; Algorithms; Automatic Data Processing; Brain Mapping; Electroencephalography; Epilepsy; Humans; Neural Networks (Computer); Sensitivity and Specificity; Signal Processing, Computer-Assisted; Time Factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5626339
Filename
5626339
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