• DocumentCode
    2922987
  • Title

    Advanced On-The-Fly Method with Correction of Initial Values to Characterize Negative Bias Temperature Instability Reliability (NBTI)

  • Author

    Benard, Christelle ; Ogier, Jean-Luc ; Goguenheim, Didier

  • fYear
    2008
  • fDate
    12-16 Oct. 2008
  • Firstpage
    0
  • Lastpage
    17
  • Keywords
    Current measurement; Degradation; Low voltage; MOSFETs; Negative bias temperature instability; Niobium compounds; Pulse measurements; Stress measurement; Time measurement; Titanium compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
  • Conference_Location
    South lake Tahoe, CA, USA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4244-2194-7
  • Electronic_ISBN
    1930-8841
  • Type

    conf

  • DOI
    10.1109/IRWS.2008.4796122
  • Filename
    4796122
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2922987