Title :
Advanced On-The-Fly Method with Correction of Initial Values to Characterize Negative Bias Temperature Instability Reliability (NBTI)
Author :
Benard, Christelle ; Ogier, Jean-Luc ; Goguenheim, Didier
Keywords :
Current measurement; Degradation; Low voltage; MOSFETs; Negative bias temperature instability; Niobium compounds; Pulse measurements; Stress measurement; Time measurement; Titanium compounds;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796122
