DocumentCode

2923036

Title

The Influence Of Complex Geometries and Stress Non-Uniformity On Reliability

Author

Aal, A.

Author_Institution

Front End Manufacturing, GOI Reliability, ELMOS Semiconductor AG, Heinrich-Hertz Str. 1, D-44227 Dortmund, Germany. andreas.aal@elmos.eu

fYear

2008

fDate

12-16 Oct. 2008

Firstpage

1

Lastpage

20

Keywords

Cleaning; Composite materials; Dielectric devices; Geometry; Materials reliability; Materials testing; Reliability theory; Semiconductor device reliability; Stress; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International

Conference_Location

South lake Tahoe, CA, USA

ISSN

1930-8841

Print_ISBN

978-1-4244-2194-7

Electronic_ISBN

1930-8841

Type

conf

DOI

10.1109/IRWS.2008.4796125

Filename

4796125