Title :
Reliability and performance of the augmented 3D-tree fault tolerant network
Author :
Belkadi, Mustapha ; Mouftah, H.T.
Author_Institution :
Dept. of Electr. Eng., Queen´´s Univ., Kingston, Ont., Canada
Abstract :
It is found that the terminal reliability under a two-fault pattern is still high when compared to that of the shuffle-Exchange network. Its MTTF (mean time to failure) however, is only slightly higher than that of the latter, and much lower than that of the 3D-Tree network as there are more switching elements that have to be fault-free. It has also been observed that, in the degraded mode of operation and the fault-pattern scenarios considered for an 8 × 8 network, the throughput is still relatively high
Keywords :
fault trees; iterated switching networks; telecommunication network reliability; telecommunication terminals; augmented 3D-tree fault tolerant network; degraded mode of operation; fault-pattern scenarios; mean time to failure; performance; switching elements; terminal reliability; throughput; Asynchronous transfer mode; B-ISDN; Degradation; Fabrics; Fault tolerance; Joining processes; Multiprocessor interconnection networks; Redundancy; Reliability engineering; Switches;
Conference_Titel :
Communications, Computers and Signal Processing, 1993., IEEE Pacific Rim Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-7803-0971-5
DOI :
10.1109/PACRIM.1993.407157
