Reliability and performance of the augmented 3D-tree fault tolerant network

Author

Belkadi, Mustapha ; Mouftah, H.T.

Author_Institution

Dept. of Electr. Eng., Queen´´s Univ., Kingston, Ont., Canada

Volume

1

fYear

1993

fDate

19-21 May 1993

Firstpage

333

Abstract

It is found that the terminal reliability under a two-fault pattern is still high when compared to that of the shuffle-Exchange network. Its MTTF (mean time to failure) however, is only slightly higher than that of the latter, and much lower than that of the 3D-Tree network as there are more switching elements that have to be fault-free. It has also been observed that, in the degraded mode of operation and the fault-pattern scenarios considered for an 8 × 8 network, the throughput is still relatively high

Keywords

fault trees; iterated switching networks; telecommunication network reliability; telecommunication terminals; augmented 3D-tree fault tolerant network; degraded mode of operation; fault-pattern scenarios; mean time to failure; performance; switching elements; terminal reliability; throughput; Asynchronous transfer mode; B-ISDN; Degradation; Fabrics; Fault tolerance; Joining processes; Multiprocessor interconnection networks; Redundancy; Reliability engineering; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Communications, Computers and Signal Processing, 1993., IEEE Pacific Rim Conference on

Conference_Location

Victoria, BC

Print_ISBN

0-7803-0971-5

Type

conf

DOI

10.1109/PACRIM.1993.407157

Filename

407157