DocumentCode

2923226

Title

Interface Traps in Silicon Carbide MOSFETs

Author

Cochrane, C.J. ; Lenahan, P.M. ; Lelis, A.J.

Author_Institution

Penn State University, University Park, PA 16802

fYear

2008

fDate

12-16 Oct. 2008

Firstpage

1

Lastpage

19

Keywords

MOSFETs; Silicon carbide;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International

Conference_Location

South lake Tahoe, CA, USA

ISSN

1930-8841

Print_ISBN

978-1-4244-2194-7

Electronic_ISBN

1930-8841

Type

conf

DOI

10.1109/IRWS.2008.4796135

Filename

4796135