Title :
Coupled Approach for Reliability Study of Fully Self Aligned SiGe:C 250GHz HBTs
Author :
Diop, M. ; Revil, N. ; Marin, M. ; Monsieur, F. ; Schwartzmann, T. ; Ghibaudo, G.
Author_Institution :
STMicroelectronics, Crolles, France; IMEP-LAHC, INP Grenoble MINATEC, France. malik.diop@st.com
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796137
