• DocumentCode
    2923252
  • Title

    Coupled Approach for Reliability Study of Fully Self Aligned SiGe:C 250GHz HBTs

  • Author

    Diop, M. ; Revil, N. ; Marin, M. ; Monsieur, F. ; Schwartzmann, T. ; Ghibaudo, G.

  • Author_Institution
    STMicroelectronics, Crolles, France; IMEP-LAHC, INP Grenoble MINATEC, France. malik.diop@st.com
  • fYear
    2008
  • fDate
    12-16 Oct. 2008
  • Firstpage
    1
  • Lastpage
    15
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
  • Conference_Location
    South lake Tahoe, CA, USA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4244-2194-7
  • Electronic_ISBN
    1930-8841
  • Type

    conf

  • DOI
    10.1109/IRWS.2008.4796137
  • Filename
    4796137
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2923252