Title :
Reliability for "future" devices
Author :
Haensch, Wilfried
Abstract :
This article consists of a collection of slides from the author´s conference presentation. Some of the specific areas/topics discussed include: Scaling (Density & Materials); Si Devices (Planar Devices: Classical, Fully depleted), (Non planar Devices: Non-Si Devices: Ge & III/V, and 1D devices); and a Summary.
Keywords :
Dielectric devices; Dielectric materials; Materials reliability; Photonic band gap; Scalability;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
S. Lake Tahoe, CA
Print_ISBN :
978-1-4244-2194-7
DOI :
10.1109/IRWS.2008.4796149
