DocumentCode :
2923795
Title :
Imaging of Defect Density Distribution in GaN using Femtosecond Pump-Probe Measurement
Author :
Horiuchi, K. ; Kamata, S. ; Kannari, F.
Author_Institution :
Department of Electronics and Electrical Engineering, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan
fYear :
2005
fDate :
30-02 Aug. 2005
Firstpage :
895
Lastpage :
896
Abstract :
Imaging of defect density distributions in GaN was carried out. We measured transient absorption of the deep impurity levels by a 400 nm probe pulse followed by three-photon carrier pumping with an 800 nm pump pulse.
Keywords :
Absorption; Density measurement; Gallium nitride; Impurities; Laser beams; Laser excitation; Photonic band gap; Probes; Pulse measurements; Ultrafast electronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2005. CLEO/Pacific Rim 2005. Pacific Rim Conference on
Print_ISBN :
0-7803-9242-6
Type :
conf
DOI :
10.1109/CLEOPR.2005.1569592
Filename :
1569592
Link To Document :
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