• DocumentCode
    2923804
  • Title

    Micron-sized, high aspect ratio bulk silicon micromechanical devices

  • Author

    Gianchandani, Yogesh ; Najafi, Khalil

  • Author_Institution
    Center for Integrated Sensors & Circuits, Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1992
  • fDate
    4-7 Feb 1992
  • Firstpage
    208
  • Lastpage
    213
  • Abstract
    The fabrication of high-aspect-ratio microstructures having widths of ≈1 μm and thicknesses exceeding 10 μm for application in a variety of microsensors and microactuators is reported. The fabrication process utilizes deep etching of fine features into boron-diffused bulk silicon wafers using chlorine- and fluorine-based reactive ion etching techniques. These wafers are then electrostatically bonded to glass wafers which have been previously patterned with metal interconnect. The wafers are finally etched in an ethylenediamine pyrocatechol solution that frees the microstructures. The process requires a total of three masking steps (two for silicon and one for glass), is single-sided, and has high yield. Structures with thickness-to-width ratios greater than 10:1 have been fabricated using this process. Electrical measurements have shown that very large deflections (>7 μm) are possible at voltages as low as 25 V
  • Keywords
    electric actuators; mechatronics; micromechanical devices; silicon; sputter etching; 1 micron; 10 micron; 25 V; 7 micron; Si:B wafers; bulk Si; deep etching; electrostatically bonded; ethylenediamine pyrocatechol solution; fabrication process; fine features; glass wafers; high yield; high-aspect-ratio microstructures; large deflections; metal interconnect; microactuators; micromechanical devices; microsensors; reactive ion etching; single-sided; thickness-to-width ratios; thicknesses; three masking steps; voltages; widths; Electric variables measurement; Etching; Fabrication; Glass; Microactuators; Micromechanical devices; Microsensors; Microstructure; Silicon; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1992, MEMS '92, Proceedings. An Investigation of Micro Structures, Sensors, Actuators, Machines and Robot. IEEE
  • Conference_Location
    Travemunde
  • Print_ISBN
    0-7803-0497-7
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1992.187719
  • Filename
    187719