Title :
16.4: 2D and 3D analysis of a 2-stage depressed collector including the effects of secondary electrons
Author :
Pamisetty, Raja Ramana Rao ; Datta, Subrata Kumar ; Deshmukh, Vijay A. ; Kumar, Lalit
Author_Institution :
Microwave Tube R&D Centre, Minist. of Defence, Bangalore, India
Abstract :
This paper describes the simulation of an axi-symmetric 2-stage depressed collector including the effects of secondary electrons using a 2D FDM based code and compares its efficacy against experimental results and 3D simulation using CST Particle Studio. The paper also demonstrates the 3D simulation of a tilted electric field (TEF) collector using CST Studio for arresting the secondary electron back-migration.
Keywords :
electric fields; electronic engineering computing; finite difference methods; secondary electron emission; travelling wave tubes; 2D FDM based code; 2D analysis; 3D analysis; 3D simulation; CST Particle Studio; axisymmetric 2-stage depressed collector; secondary electron back-migration; tilted electric field collector; traveling wave tube; Analytical models; Degradation; Electron beams; Electron tubes; Magnetic analysis; Microwave technology; Permanent magnets; Poisson equations; Radio frequency; Research and development; Depressed collector; asymmetric collector; tilted electric filed (TEF) collector; traveling-wave tube;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
DOI :
10.1109/IVELEC.2010.5503374
