16.4: 2D and 3D analysis of a 2-stage depressed collector including the effects of secondary electrons

Author

Pamisetty, Raja Ramana Rao ; Datta, Subrata Kumar ; Deshmukh, Vijay A. ; Kumar, Lalit

Author_Institution

Microwave Tube R&D Centre, Minist. of Defence, Bangalore, India

fYear

2010

fDate

18-20 May 2010

Firstpage

411

Lastpage

412

Abstract

This paper describes the simulation of an axi-symmetric 2-stage depressed collector including the effects of secondary electrons using a 2D FDM based code and compares its efficacy against experimental results and 3D simulation using CST Particle Studio. The paper also demonstrates the 3D simulation of a tilted electric field (TEF) collector using CST Studio for arresting the secondary electron back-migration.

Keywords

electric fields; electronic engineering computing; finite difference methods; secondary electron emission; travelling wave tubes; 2D FDM based code; 2D analysis; 3D analysis; 3D simulation; CST Particle Studio; axisymmetric 2-stage depressed collector; secondary electron back-migration; tilted electric field collector; traveling wave tube; Analytical models; Degradation; Electron beams; Electron tubes; Magnetic analysis; Microwave technology; Permanent magnets; Poisson equations; Radio frequency; Research and development; Depressed collector; asymmetric collector; tilted electric filed (TEF) collector; traveling-wave tube;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference (IVEC), 2010 IEEE International

Conference_Location

Monterey, CA

Print_ISBN

978-1-4244-7098-3

Type

conf

DOI

10.1109/IVELEC.2010.5503374

Filename

5503374