DocumentCode
2924310
Title
Improved Reflection-Method for Refractive Index Measurements of Optical Waveguides
Author
Youk, Youngchun ; Kim, Dug Young
Author_Institution
Department of Information and Communications, Gwangju Institute of Science and Technology, 1 Oryongdong, Bukgu, Gwangju, 500-712, South Korea ycyouk@gist.ac.kr
fYear
2005
fDate
30-02 Aug. 2005
Firstpage
961
Lastpage
962
Abstract
An improved technique for measuring the refractive index profile of optical waveguides using a modified confocal scanning optical microscope with a stable light source, a low signal system, and a simple feedback scheme is described.
Keywords
Optical feedback; Optical fibers; Optical interferometry; Optical microscopy; Optical refraction; Optical sensors; Optical signal processing; Optical variables control; Optical waveguides; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2005. CLEO/Pacific Rim 2005. Pacific Rim Conference on
Print_ISBN
0-7803-9242-6
Type
conf
DOI
10.1109/CLEOPR.2005.1569622
Filename
1569622
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