DocumentCode :
2924310
Title :
Improved Reflection-Method for Refractive Index Measurements of Optical Waveguides
Author :
Youk, Youngchun ; Kim, Dug Young
Author_Institution :
Department of Information and Communications, Gwangju Institute of Science and Technology, 1 Oryongdong, Bukgu, Gwangju, 500-712, South Korea ycyouk@gist.ac.kr
fYear :
2005
fDate :
30-02 Aug. 2005
Firstpage :
961
Lastpage :
962
Abstract :
An improved technique for measuring the refractive index profile of optical waveguides using a modified confocal scanning optical microscope with a stable light source, a low signal system, and a simple feedback scheme is described.
Keywords :
Optical feedback; Optical fibers; Optical interferometry; Optical microscopy; Optical refraction; Optical sensors; Optical signal processing; Optical variables control; Optical waveguides; Refractive index;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2005. CLEO/Pacific Rim 2005. Pacific Rim Conference on
Print_ISBN :
0-7803-9242-6
Type :
conf
DOI :
10.1109/CLEOPR.2005.1569622
Filename :
1569622
Link To Document :
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