• DocumentCode
    2924394
  • Title

    Evaluating the effectiveness of optical coupling techniques

  • Author

    Wohlgemuth, J.H. ; Koval, T. ; Whitehouse, D. ; Creager, J.

  • Author_Institution
    Solarex Corp., Frederick, MD, USA
  • Volume
    2
  • fYear
    1994
  • fDate
    5-9 Dec 1994
  • Firstpage
    1450
  • Abstract
    It is important to maximize the amount of sunlight optically coupled into a solar cell. The usual approach to evaluate optical coupling is to fabricate solar cells and then to measure their performance under standard test conditions, using the short circuit current as the figure of merit. This approach suffers from several short comings, including spectral mismatch errors in the measurement and process induced variations in the performance. This paper presents an improved methodology for evaluating optical coupling, based on measuring the reflectance of sample surfaces as a function of wavelength. The effect of using this surface geometry on a particular cell can then be calculated using values of previously measured internal quantum efficiency for the cell technology selected. Data on a variety of surface texture treatments are presented
  • Keywords
    optical couplers; optical variables measurement; reflectivity; solar cells; sunlight; surface texture; surface treatment; internal quantum efficiency; optical coupling; reflectance measurement; solar cell; spectral mismatch errors; standard test conditions; sunlight; surface geometry; surface texture treatments; Circuit testing; Coupling circuits; Current measurement; Measurement standards; Optical coupling; Optical surface waves; Photovoltaic cells; Short circuit currents; Surface treatment; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    0-7803-1460-3
  • Type

    conf

  • DOI
    10.1109/WCPEC.1994.520222
  • Filename
    520222