DocumentCode :
2924559
Title :
Scattering and the prediction of Quantum Efficiency and response time characteristics
Author :
Jensen, Kevin L. ; Yater, Joan E. ; Shaw, Jon L. ; Pate, Brad B. ; Montgomery, Eric J. ; Feldman, Donald W. ; Shea, Patrick G O ; Petillo, John J.
Author_Institution :
Code 6843, Naval Res. Lab., Washington, DC, USA
fYear :
2012
fDate :
24-26 April 2012
Firstpage :
249
Lastpage :
250
Abstract :
Quantum Efficiency from photocathodes and Yield from diamond secondary emitters are affected by scattering during electron transport in bulk material. The emission distribution is required to predict how current density and emittance from these sources affect beam transport in Particle-in-Cell codes, particularly MICHELLE. Monte Carlo is used to augment a standard Three-Step-Model (TSM) based model used for photocathodes, and to model secondary emission inside the thin film diamond flake in a Diamond Current Amplifier. In both, how electron bunches generated within the semiconductor material evolve under band bending and transport change how many are emitted, and consequently the temporal characteristics and phase space distribution of the emitted bunch are likewise changed. We describe the status of the emission models, how scattering changes the temporal characteristics, and progress in developing simple models to account for the effects of scattering in a manner appropriate for incorporation into MICHELLE.
Keywords :
Monte Carlo methods; amplifiers; current density; diamond; particle beam bunching; photocathodes; photoemission; scattering; semiconductor materials; thin films; MICHELLE; Monte Carlo process; TSM; band bending; current density; diamond current amplifier; diamond secondary emitters; electron bunches; electron transport; emission distribution; emission models; emittance; particle-in-cell codes; phase space distribution; photocathodes; quantum efficiency; response time characteristics; scattering effect; semiconductor material; standard three-step-model; thin film diamond flake; Cathodes; Diamond-like carbon; Monte Carlo methods; Photoelectricity; Predictive models; Scattering; Shape; Diamond Current Amplifier; Monte Carlo; Particle-in-Cell Code; Photocathode; Photoemission; Secondary Emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference (IVESC), 2012 IEEE Ninth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0368-2
Type :
conf
DOI :
10.1109/IVESC.2012.6264180
Filename :
6264180
Link To Document :
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