• DocumentCode
    2924575
  • Title

    The impact of new applications on thermal properties data requirements [electronic packages]

  • Author

    Tye, R.P. ; Maesono, A.

  • fYear
    1992
  • fDate
    5-8 Feb 1992
  • Firstpage
    253
  • Lastpage
    256
  • Abstract
    The various thermal parameters affecting the design and performance of electronics packages, using materials in these forms, are discussed. They are illustrated with results obtained on different materials and combinations using several new or modified techniques developed specifically to measure appropriate properties of small specimen configurations. These include: the measurement of thermal expansion of small specimens to very high precision, enabling improved matching of composite wafers and components to be attained; the measurement of specific heat of thin films to high precision, enabling development of improved superconductor materials; and the measurement of thermal diffusivity of materials and multilayered composites. The effect of various parameters is discussed, including difference in property from that of the bulk solid, anisotropy in property, and homogeneity and uniformity
  • Keywords
    Composite materials; Conducting materials; Electronic packaging thermal management; Laser beams; Optical interferometry; Semiconductor device packaging; Solids; Superconducting materials; Thermal conductivity; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Phenomena in Electronic Systems, 1992. I-THERM III, InterSociety Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-0503-5
  • Type

    conf

  • DOI
    10.1109/ITHERM.1992.187770
  • Filename
    187770