DocumentCode
2924582
Title
Tolerating process variations in high-level synthesis using transparent latches
Author
Chen, Yibo ; Xie, Yuan
Author_Institution
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA
fYear
2009
fDate
19-22 Jan. 2009
Firstpage
73
Lastpage
78
Abstract
Considering process variability at the behavior synthesis level is necessary, because it makes some instances of function units slower and others faster, resulting in unbalanced control steps and reducing the attainable frequency of the circuit. To tackle this problem, this paper proposes a methodology to replace the edge-trigged flip-flops by transparent latches, to exploit latches´ extra ability of passing time slacks and tolerating delay variations. In the paper we first define the timing yield in high-level synthesis, and then present how to replace flip-flops with latches to improve timing yield and mitigate the impact of process variations. We then discuss the benefits and overheads for the replacement, and propose an optimization framework for latch replacement in high-level synthesis design flow. Experimental results show that the latch-based design can achieve an average of 27% improvement of timing yield compared with traditional flip-flop based design.
Keywords
flip-flops; logic design; optimisation; edge-trigged flip-flops; flip-flop based design; high-level synthesis; optimization framework; synthesis design flow; synthesis level; tolerating delay variations; transparent latches; Circuit synthesis; Clocks; Delay; Flip-flops; High level synthesis; Latches; Resource management; Threshold voltage; Timing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
978-1-4244-2748-2
Electronic_ISBN
978-1-4244-2749-9
Type
conf
DOI
10.1109/ASPDAC.2009.4796444
Filename
4796444
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