• DocumentCode
    2924648
  • Title

    Non-Fourier heat conduction in IC chip

  • Author

    Guo, Zeng-Yuan ; Xu, Yun-Sheng

  • Author_Institution
    Dept. of Eng. Mech., Tsinghua Univ., Beijing, China
  • fYear
    1992
  • fDate
    5-8 Feb 1992
  • Firstpage
    271
  • Lastpage
    275
  • Abstract
    The authors address heat conduction in an IC chip with special attention paid to the evaluation of the non-Fourier effect and its importance for the thermal analysis and design of an IC chip. Instead of the classic Fourier equation based on the diffusion mechanism, a finite-speed propagation model in a spherical system expressed in a hyperbolic equation is used to predict the transient process of heat conduction, when a heat source with a square-corner switching wave form is applied. The peak temperature, spatial difference, and time variation of temperature which are critical to the thermal reliability of the chip are given and compared with that obtained from the Fourier equation. Analytical and numerical results show that non-Fourier effects covering the higher peak temperature and thermal stresses, a larger temperature difference between components, and stronger thermal noises are significant to IC chip reliability. It is suggested that if the product or shift frequency and the relaxation time of the medium exceeds 0.1 it is necessary to take non-Fourier effects into consideration
  • Keywords
    heat conduction; monolithic integrated circuits; semiconductor device models; thermal analysis; IC chip; finite-speed propagation model; heat conduction; hyperbolic equation; non-Fourier effect; nonFourier effect; peak temperature; product frequency; relaxation time; shift frequency; spherical system; thermal analysis; thermal noises; thermal reliability; thermal stresses; transient process; Chemical lasers; Electronic packaging thermal management; Frequency; Heat engines; Maxwell equations; Rapid thermal processing; Temperature sensors; Thermal conductivity; Thermal management; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Phenomena in Electronic Systems, 1992. I-THERM III, InterSociety Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-0503-5
  • Type

    conf

  • DOI
    10.1109/ITHERM.1992.187774
  • Filename
    187774