• DocumentCode
    2924650
  • Title

    Field emission from mechanical pencil lead and graphite edges

  • Author

    Endo, Toshihiro ; Higuchi, Toshiharu ; Yamada, Yoichi ; Sasaki, Masahiro

  • Author_Institution
    Inst. of Appl. Phys., Univ. of Tsukuba, Tsukuba, Japan
  • fYear
    2012
  • fDate
    24-26 April 2012
  • Firstpage
    307
  • Lastpage
    308
  • Abstract
    To clarify the origin of the superior FE characteristics observed from mechanical pencil lead, we have examined the FE features and the ambient gas effects on FE as well as FIM/FEM images of the edge of graphite flakes, consisting of vertically aligned graphene edges.
  • Keywords
    electron field emission; field emission electron microscopy; field emission ion microscopy; graphene; graphite; C; FIM-FEM images; field emission; field ion microscopy-field emission microscopy images; graphite flakes; mechanical pencil lead; vertically aligned graphene edge; Electric fields; Finite element methods; Fluctuations; Gases; Image edge detection; Iron; ambient gases; field emission; field emission microscopy; field ion microscopy; graphite; mechanical pencil lead;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference (IVESC), 2012 IEEE Ninth International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4673-0368-2
  • Type

    conf

  • DOI
    10.1109/IVESC.2012.6264185
  • Filename
    6264185
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2924650