Characterization of multi-beam cathode using thermionic emission microscope

Author

Shukla, Sushil K. ; Ruddarraju, Suryanarayana R. ; Prajesh, Rahul ; Rajoriya, Niharika

Author_Institution

Rajasthan, Microwave Tubes Div., Banasthali Univ., Pilani, India

fYear

2012

fDate

24-26 April 2012

Firstpage

345

Lastpage

346

Abstract

Thermionic emission microscope (THEM) is an analytical research tool to study the emission uniformity of a thermionic cathode. In this paper, the design of electrostatic lens for a multi-beam cathode (MBC) has been given using 2-D TRAK and Omni-TRAK codes. The design of single beam lens system, available with us, containing a small cathode has been modified to study large size MBC using scaling laws. The present MBC contains 19 protruding buttons contributing to 19 beamlets whose image is projected onto the screen for study. The influence of various parameters such as protrusion, diameter of button, and their interspacing has been studied. The studies prove that THEM could be used as an effective tool for the characterization of MBC.

Keywords

electron microscopes; electrostatic lenses; thermionic cathodes; thermionic emission; 2D TRAK codes; THEM; electrostatic lens design; emission uniformity; large size MBC; multibeam cathode characterization; omniTRAK codes; scaling laws; single beam lens system design; thermionic cathode; thermionic emission microscope; Cathodes; Electrostatics; Lenses; Microscopy; Thermionic emission; Trajectory; 2-D TRAK; MBC; Omni-TRAK; THEM; immersion lens; scaling laws;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electron Sources Conference (IVESC), 2012 IEEE Ninth International

Conference_Location

Monterey, CA

Print_ISBN

978-1-4673-0368-2

Type

conf

DOI

10.1109/IVESC.2012.6264190

Filename

6264190