• DocumentCode
    2924880
  • Title

    14.1: Performance analysis of a high current density magnetron injection gun

  • Author

    Barnett, Larry R. ; Luhmann, Neville C., Jr. ; Chiu, Chen-Chi ; Chu, Kwo Ray

  • Author_Institution
    Dept. of Appl. Sci., Univ. of California, Davis, CA, USA
  • fYear
    2010
  • fDate
    18-20 May 2010
  • Firstpage
    311
  • Lastpage
    312
  • Abstract
    Electron beam quality is essential to the performance of millimeter-wave gyro-amplifiers, which is extremely sensitive to the electron velocity spread and emission uniformity. As one moves up in power and frequency, the quality of the electron beam becomes even more critical. One aspect of the electron beam formation technology which has received relatively little attention has been the performance analysis of the electron beam itself. In this study, a 100 kV, 8 A magnetron injection gun (MIG) with a calculated perpendicular-to-parallel velocity ratio of 1.4 and axial velocity spread of 3.5% has been designed, tested, and analyzed. It is shown that the equipment precision and a relativistic data analysis model afford sufficient resolution to allow a verification of the theoretical predictions as well as a quantitative inference to the surface roughness of the cathode used.
  • Keywords
    cathodes; current density; electron beams; magnetrons; millimetre wave amplifiers; current 8 A; electron beam formation technology; electron beam quality; electron velocity spread; emission uniformity; high-current density magnetron injection gun; millimeter-wave gyroamplifiers; perpendicular-to-parallel velocity ratio; relativistic data analysis model; surface roughness; theoretical predictions; voltage 100 kV; Current density; Data analysis; Electron beams; Electron emission; Frequency; Magnetic analysis; Millimeter wave technology; Performance analysis; Predictive models; Testing; experimental test; high current density; magnetron injection gun; relativistic analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2010 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-7098-3
  • Type

    conf

  • DOI
    10.1109/IVELEC.2010.5503424
  • Filename
    5503424