DocumentCode
2924880
Title
14.1: Performance analysis of a high current density magnetron injection gun
Author
Barnett, Larry R. ; Luhmann, Neville C., Jr. ; Chiu, Chen-Chi ; Chu, Kwo Ray
Author_Institution
Dept. of Appl. Sci., Univ. of California, Davis, CA, USA
fYear
2010
fDate
18-20 May 2010
Firstpage
311
Lastpage
312
Abstract
Electron beam quality is essential to the performance of millimeter-wave gyro-amplifiers, which is extremely sensitive to the electron velocity spread and emission uniformity. As one moves up in power and frequency, the quality of the electron beam becomes even more critical. One aspect of the electron beam formation technology which has received relatively little attention has been the performance analysis of the electron beam itself. In this study, a 100 kV, 8 A magnetron injection gun (MIG) with a calculated perpendicular-to-parallel velocity ratio of 1.4 and axial velocity spread of 3.5% has been designed, tested, and analyzed. It is shown that the equipment precision and a relativistic data analysis model afford sufficient resolution to allow a verification of the theoretical predictions as well as a quantitative inference to the surface roughness of the cathode used.
Keywords
cathodes; current density; electron beams; magnetrons; millimetre wave amplifiers; current 8 A; electron beam formation technology; electron beam quality; electron velocity spread; emission uniformity; high-current density magnetron injection gun; millimeter-wave gyroamplifiers; perpendicular-to-parallel velocity ratio; relativistic data analysis model; surface roughness; theoretical predictions; voltage 100 kV; Current density; Data analysis; Electron beams; Electron emission; Frequency; Magnetic analysis; Millimeter wave technology; Performance analysis; Predictive models; Testing; experimental test; high current density; magnetron injection gun; relativistic analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4244-7098-3
Type
conf
DOI
10.1109/IVELEC.2010.5503424
Filename
5503424
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