DocumentCode
2925002
Title
A study of tungstate formation in dispenser cathodes
Author
Tighe, William ; Martin, Russell
Author_Institution
L-3 Commun. Electron Technol. Inc., Torrance, CA, USA
fYear
2012
fDate
24-26 April 2012
Firstpage
471
Lastpage
472
Abstract
L-3 Communications ETI has been involved in the manufacture of Vacuum Electron Devices (VEDs) for over 50 years. The cathode is a critical component of the VED and L-3 ETI has developed in-house facilities for the research, development, manufacture, and test of the Space TWT cathode [1, 2]. In addition to cathodes used in VEDs, the Electric Propulsion Product Line at L-3 ETI uses hollow dispenser cathodes. In this area as well, L-3 ETI has invested resources in research and test. The performance of the M-coated dispenser cathode over time depends primarily on the diffusion of the M-coat layer and the depletion of barium. For the hollow cathode, the depletion of barium is considered the primary life-limiting factor. The depletion of barium is dominated by evaporation but the chemical reactions that occur inside the dispenser pellet can produce barium tungstates that effectively prevent the barium from migrating to the surface. This presentation examines the role of barium tungstate formation on the life of the cathode.
Keywords
barium; cathodes; chemical reactions; diffusion; electron tube manufacture; electron tube testing; evaporation; travelling wave tubes; tungsten; Ba-W; ETI L-3 communications; M-coat layer diffusion; M-coated dispenser cathode; VED; barium depletion; barium tungstate formation study; chemical reactions; dispenser pellet; electric propulsion product line; evaporation; hollow dispenser cathodes; primary life-limiting factor; space TWT cathode testing; vacuum electron devices; Barium; Cathodes; Discharges (electric); Electron devices; Manufacturing; Propulsion; Temperature measurement; Activation Energy; Dispenser Cathodes; Hollow Cathodes; Life Model; Tungstates;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference (IVESC), 2012 IEEE Ninth International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4673-0368-2
Type
conf
DOI
10.1109/IVESC.2012.6264201
Filename
6264201
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