• DocumentCode
    2925112
  • Title

    Ultrafast semiconductor measurements

  • Author

    Del, P.J.

  • Author_Institution
    Univ. of Central Florida
  • fYear
    2000
  • fDate
    7-12 May 2000
  • Firstpage
    357
  • Lastpage
    357
  • Abstract
    CWP 2:30 pm-4:i5 pm, Room 104. Presider: Peter J. Delfyett, Univ. of Central Florida, USA.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-634-6
  • Type

    conf

  • DOI
    10.1109/CLEO.2000.907114
  • Filename
    907114
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2925112