DocumentCode :
2925300
Title :
Trial pruning for classification of single-trial EEG data during motor imagery
Author :
Wang, Boyu ; Wong, Chiman ; Wan, Feng ; Mak, Peng Un ; Mak, Pui In ; Vai, Mang I.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Macau, Macau, China
fYear :
2010
fDate :
Aug. 31 2010-Sept. 4 2010
Firstpage :
4666
Lastpage :
4669
Abstract :
Due to the artifacts in electroencephalography (EEG) data, the performance of brain-computer interface (BCI) is degraded. On the other hand, in the motor imagery based BCI system, EEG signals are usually contaminated by the misleading trials caused by improper imagination of a movement. In this paper, we present a novel algorithm to detect the abnormal EEG data using genetic algorithm (GA). After trial pruning, a subset of the EEG data are selected, on which common spatial pattern (CSP) and Gaussian classifier are trained. The performance of the proposed method is tested on Data set IIa of BCI Competition IV, and the simulation result demonstrates a significant improvement for six out of nine subjects.
Keywords :
Gaussian distribution; biomechanics; brain-computer interfaces; electroencephalography; genetic algorithms; medical signal processing; signal classification; EEG; Gaussian classifier; brain-computer interface; common spatial pattern; electroencephalography; genetic algorithm; motor imagery; trial pruning method; Classification algorithms; Electroencephalography; Feature extraction; Gallium; Noise; Noise measurement; Robustness; Algorithms; Diagnosis, Computer-Assisted; Electroencephalography; Evoked Potentials, Motor; Humans; Motor Cortex; Movement; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4123-5
Type :
conf
DOI :
10.1109/IEMBS.2010.5626453
Filename :
5626453
Link To Document :
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