DocumentCode :
2925356
Title :
19.1: Status of the MICHELLE code and applications
Author :
Petillo, John ; Panagos, Dimitrios ; Ovtchinnikov, Serguei ; Burke, Alex ; Kostas, Chris ; Held, Ben ; DeFord, John ; Nelson, Eric ; Nguyen, Khanh ; Wright, Ed ; Jensen, Kevin ; Levush, Baruch
Author_Institution :
Sci. Applic. Int. Corp., Billerica, MA, USA
fYear :
2010
fDate :
18-20 May 2010
Firstpage :
439
Lastpage :
440
Abstract :
The MICHELLE code is a Finite-Element Electrostatic Particle in Cell code for application to 2D and 3D particle beam formation, transport, and collection. Although its initial development focus had been for DC electron guns and depressed collectors, other applications such as RF electron guns, ion thrusters, photocathodes and e-beam lithography have become a recent focus. The MICHELLE code´s ability to manage large mesh sizes and large particle counts in complex geometries requiring the resolution of disparate spatial scales in 2D and 3D on desktop computers has allowed it to be applied to devices that previously could not have been readily modeled. This presentation gives an overview of recent applications, capabilities, and the current status of MICHELLE. A gun optimization problem will be presented and the effects of different modeling parameters and meshing techniques will be discussed.
Keywords :
codes; electron guns; electrostatics; mesh generation; particle beams; 2D particle beam formation; 3D particle beam formation; DC electron guns; MICHELLE code; RF electron guns; depressed collectors; desktop computers; e-beam lithography; finite-element electrostatic particle in cell code; gun optimization problem; ion thrusters; meshing techniques; photocathodes; Application software; Cathodes; Computational geometry; Electron guns; Electrostatics; Finite element methods; Lithography; Particle beams; Radio frequency; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
Type :
conf
DOI :
10.1109/IVELEC.2010.5503446
Filename :
5503446
Link To Document :
بازگشت