DocumentCode :
2925698
Title :
P4-11: Secondary electron emission database
Author :
Safier, Pedro N. ; Yater, Joan E. ; Myers, Robert E. ; Levush, Baruch
Author_Institution :
S&J Solutions LLC, Alexandria, VA, USA
fYear :
2010
fDate :
18-20 May 2010
Firstpage :
467
Lastpage :
468
Abstract :
We present measurements of secondary electron emission obtained with a new NRL measurement system. This system allows us to measure in two orthogonal angular directions, the energy-dependent emission for different incident angles and beam energies.
Keywords :
secondary electron emission; NRL measurement system; beam energies; energy-dependent emission; incident angles; multi-stage depressed collectors; secondary electron emission; Abstracts; Current measurement; Databases; Detectors; Electrodes; Electron beams; Electron emission; Energy measurement; Laboratories; Plasma measurements; multi-stage depressed collectors; secondary electron emission; simulations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
Type :
conf
DOI :
10.1109/IVELEC.2010.5503460
Filename :
5503460
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2925698
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