Title :
Miniature variable optical delay using silicon micromachined scanning mirrors
Author :
Cornett, K.T. ; Hagelin, P.M. ; Heritage, J.P. ; Solgaard, Olav ; Everett, Michael
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
Abstract :
Summary form only given.Optical coherence tomography (OCT) is a cross-sectional optical technique for high-resolution clinical imaging of microstructure in biological systems. OCT performs spatially localized imaging by combining coherent signal acquisition and joint time frequency analysis of wide-band near IR radiation in a white light interferometer. The technique requires a rapid (/spl sim/1-2 kHz) scanning optical delay (RSOD) in order to construct images at 4-8 Hz. Quasi-real time OCT imaging with a delay line of /spl sim/3 mm/sup 2/ has been demonstrated using scanners based on technology originally developed for femtosecond optical pulse diagnostics. We report the development of compact RSOD scanners that use, for the first time, silicon micromachined scanning mirrors. Use of a micromirror allows for high speed and low mechanical vibration. We investigate the design trades-off of a RSOD optimized for the stringent requirements of OCT, namely, large optical bandwidth and long linearly scanned delay range.
Keywords :
micro-optics; micromachining; mirrors; optical delay lines; optical scanners; optical tomography; silicon; Si; coherent signal acquisition; cross-sectional optical technique; design trades-off; femtosecond optical pulse diagnostics; high-resolution clinical imaging; joint time frequency analysis; large optical bandwidth; long linearly scanned delay range; low mechanical vibration; microstructure; miniature variable optical delay; optical coherence tomography; rapid scanning optical delay; silicon micromachined scanning mirrors; white light interferometer; wide-band near IR radiation; Biomedical optical imaging; Delay lines; High speed optical techniques; High-resolution imaging; Microstructure; Optical imaging; Optical interferometry; Silicon; Tomography; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.907151