DocumentCode
292580
Title
Equivalence of physical optics and aperture field integration method in the full pattern analysis
Author
Oodo, I. ; Ando, M.
Author_Institution
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Japan
Volume
1
fYear
1994
fDate
20-24 June 1994
Firstpage
66
Abstract
Physical optics (PO) and the aperture field integration method (AFIM) are high frequency approximation methods which are widely used for the analysis of reflector antennas. For an offset reflector, PO predicts asymmetric far field patterns in the offset plane, while AFIM in choosing the integration plane normal to the boresight direction always predicts symmetric patterns which are generally inaccurate. AFIM, however, in choosing the integration plane that caps the reflector predicts fields similar to those of PO within the first few sidelobes. In previous discussions, only the component which is reflected from the reflector is used as the equivalent currents in AFIM. In the present paper, the authors extend the equivalence of PO and AFIM to the whole observation angle. In view of the field equivalence theorem, the equivalent currents in AFIM consist of both the incident and the reflected fields. The authors numerically demonstrate that the far fields from the above AFIM excellently agree with the PO fields even in back observation angles. The equivalence is also discussed analytically in terms of high frequency approximation.<>
Keywords
antenna radiation patterns; electric current; offset reflector antennas; physical optics; aperture field integration method; equivalent currents; far field patterns; full pattern analysis; high frequency approximation methods; incident fields; offset reflector; physical optics; reflected fields; reflector antennas; Aperture antennas; Approximation methods; Feeds; Frequency; Integrated optics; Magnetic analysis; Optical scattering; Pattern analysis; Physical optics; Reflector antennas;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1994. AP-S. Digest
Conference_Location
Seattle, WA, USA
Print_ISBN
0-7803-2009-3
Type
conf
DOI
10.1109/APS.1994.407809
Filename
407809
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