DocumentCode
2925858
Title
How does openness affect academic production? Empirical evidence from the National Key Laboratories of China
Author
Lv, Ping ; Liu, Xielin
Author_Institution
Grad. Univ. of Chinese Acad. of Sci., China
fYear
2011
fDate
27-30 June 2011
Firstpage
836
Lastpage
844
Abstract
By using data on 204 National Key Laboratories of China during the period 2006-2009, this paper investigates how openness influences scientific innovation and technological innovation, which are measured by publications and patents respectively at the laboratory level. The results of the estimation of negative binomial regression models indicate that: the links with industry, international cooperation, and the proportion of non-permanent staff all have significant effects on publication output, and both the links with industry and the proportion of non-permanent staff have a U-shape relationship with publication output, while international cooperation has an inverted U-shape with publication output. International cooperation and the proportion of non-permanent staff also have significant effects on patent output, and international cooperation has an inverted U-shape with patent output, while the proportion of non-permanent researchers is negatively associated with patent output. This paper also reveals the relationship between scientific innovation and technological innovation. Relevant policy suggestions are put forward on how to improve scientific and technological innovation of public research organizations from the perspective of open innovation model.
Keywords
binomial distribution; innovation management; regression analysis; China; U-shape relationship; academic production; international cooperation; national key laboratories; negative binomial regression models; open innovation model; public research organizations; scientific innovation; technological innovation; Biological system modeling; Commercialization; Industries; Laboratories; Organizations; Patents; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
Technology Management Conference (ITMC), 2011 IEEE International
Conference_Location
San Jose, CA
Print_ISBN
978-1-61284-951-5
Type
conf
DOI
10.1109/ITMC.2011.5996064
Filename
5996064
Link To Document