Title :
Exact two-port study of symmetric and asymmetric microstrip crossed antennas
Author :
Corre, J.H. ; Gillard, R. ; Drissi, M. ; Citerne, J.
Author_Institution :
IPSIS, Sevigne, France
Abstract :
Two-port planar antennas are commonly used to generate circular polarization, switchable linear polarization or to achieve dual frequency radiating sources. Unfortunately, most analyses rely on a theoretical study of the corresponding one-port structure assuming a perfect isolation between the two ports at the operating frequency. This paper presents a rigorous study of microstrip crossed antennas using the integral equations technique. The simulation of matched terminations makes it possible to consider the antenna as an actual two-port network and to extract its scattering parameters and any component of its radiation patterns. This is necessary to understand the electromagnetic behavior of this antenna over a wide frequency range. This approach is applied to the study of two different configurations: the first one involves identical crossed dipoles and can be used to produce circular polarization; in the second case one dipole is shortened in order to obtain a dual frequency operating mode.<>
Keywords :
antenna radiation patterns; dipole antennas; electromagnetic wave polarisation; integral equations; microstrip antennas; two-port networks; asymmetric microstrip crossed antennas; circular polarization; crossed dipoles; dual frequency operating mode; dual frequency radiating sources; electromagnetic behavior; integral equations technique; matched terminations; operating frequency; planar antennas; radiation patterns; scattering parameters; switchable linear polarization; symmetric microstrip crossed antennas; two-port study; Antenna accessories; Antenna radiation patterns; Electromagnetic radiation; Frequency; Integral equations; Microstrip antennas; Pattern matching; Planar arrays; Polarization; Scattering parameters;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1994. AP-S. Digest
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-2009-3
DOI :
10.1109/APS.1994.407869