P2-35: Effects of MICHELLE thermal beam modeling on Ka-Band devices

Author

Gajaria, Deepika D. ; Vlasov, Alexander N. ; Nguyen, Khanh T. ; Burke, Alex ; Chernavskiy, Igor A. ; Petillo, John

Author_Institution

CPI, Palo Alto, CA, USA

fYear

2010

fDate

18-20 May 2010

Firstpage

291

Lastpage

292

Abstract

The effect of thermal velocities on beam formation and PPM focused beam transport, including cathode edge emission, are studied. MICHELLE simulations of a Ka-Band electron gun are presented that include a thermal beam emission model for a hot cathode, and these are compared to “cold” beam simulation results. Details of the MICHELLE thermal beam model are described, including an explanation of different options for configuring the model in the user interface, and which settings were used. The effects of thermal velocity spread on beam-wave interaction in a Ka-Band CC-TWT are discussed with applications to interaction code simulations.

Keywords

electron guns; travelling wave tubes; Ka-Band CC-TWT; Ka-Band devices; Ka-band electron gun; MICHELLE simulation; MICHELLE thermal beam modeling; beam formation; beam transport; beam-wave interaction; cathode edge emission; cold beam simulation; hot cathode; interaction code simulation; thermal beam emission model; thermal velocities; user interface; Cathodes; Coupling circuits; Current density; Electron beams; Electron emission; Electron guns; Magnetostatic waves; Optical coupling; Space charge; Steady-state; coupled cavity TWT; electron gun modeling; millimeter wavelength devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference (IVEC), 2010 IEEE International

Conference_Location

Monterey, CA

Print_ISBN

978-1-4244-7098-3

Type

conf

DOI

10.1109/IVELEC.2010.5503487

Filename

5503487